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Today's electronics have reached a point where sheer computation power has combined form and function as the key driver of large consumer markets. The demand for portable and pervasive electronics with greater functionality promises significant changes over the next decades in how society interacts
Our research on quantum frequency conversion follows two main tracks. First, we combine relatively mature frequency conversion technology based on periodically-poled lithium niobate waveguides with quantum light generated by single semiconductor quantum dots in proof-of-principle experiments that
For quantum applications, it is important to generate quantum states of light and detect them with extremely high efficiency. This project explores the metrology challenges associated with precision measurement of single photon sources and detectors. The classical photonic radiometry techniques used
We investigate the interaction of light with semiconductor-based nanostructures. We extend concepts of entanglement and coherence in atomic physics to our solid-state systems. Our devices are based on semiconductors, like GaAs. We use InAs quantum dots (QDs) in GaAs as artificial atoms; they have
An electron hologram is a fringe modulated image containing the amplitude and phase information of an electron transparent object. The HolograFREE routines
The MIST program has been developed to provide users with a general application to model an integrated scattering system. The program performs an integration of
SCATMECH is an object-oriented C++ class library developed to distribute models for light scattering applications. Included in the library are models for
A new facility has been commissioned to the establish ultraviolet spectral power responsivity in the air-ultraviolet spectral range between 200 nm and 400 nm
Detector calibrations are a crucial component of the United States industry's extreme ultraviolet (EUV) calibrations needs. Both EUV source manufacturers and
Summary The Normal incidence Diffuse Optical Scatter Instrument (NDOSI) is a new facility for measuring the hemispherical reflectance and transmittance of
This facility enables the measurement of spectral emittance using the direct method of radiance comparison of the sample with a blackbody reference source